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TECHNOLOGY 技术领域
Auto Visual Test
> 技术领域 > Visual Test > Auto Visual Test
Tester
| Vendor | Model | Test head | Data Patten Memory | Test data rates | Software |
|---|---|---|---|---|---|
| Teradyne | IP750 | 512 digital / O pins | 16 Meg Per Pin Vector Memory | 100MHz | Windows XP IG-XL |
Handler
| Vendor | Model | Device Type | DTest Mode | Temperature |
|---|---|---|---|---|
| Seiko Epson | Ns-8080MS | CSP, BGA, QFN, CLCC, PLCC... |
8-site(4×2), Square 4-site(2×2), In-LIne 4-site(4×1), 2-site Single |
25-130℃ |
| Ateco | AL0408NT | CSP, BGA, QFN, CLCC, PLCC... |
8-site(4×2), Square 4-site(2×2), In-LIne 4-site(4×1), 2-site Single |
N/A |